Publications Professor Dr. rer. nat. habil. Ralf B. Bergmann

Bibliographical data (end of February 2017):
h-index = 23, 266 publications and approx. 2500 citations (according to Harzing „Publish or Perish)

books and book chapters

C. von Kopylow, R. B. Bergmann
Optical Metrology
in: Micro Metal Forming, F. Vollertsen (Ed.)
(Springer, Berlin, 2013), 392 – 404

Bergmann, R. B.; Huke, P.
Advanced methods for optical non-destructive testing
In: Optical Imaging and Metrology: Advanced Technologies. Eds.: W. Osten, N. Reingand,
Wiley-VCH Weinheim (2012) 393-412

Bergmann, R. B.; Drabarek, P.; Kallmann, U.; Schmidtke, B.; Bauer J.
Interferometrische Submikrometer-Messtechnik in der Automobilindustrie
In: Photonik – Grundlagen, Technologie und Anwendung. Hrsg. E. Hering, R. Martin,
Springer Verlag Berlin-Heidelberg (2006) 263-281

Bergmann, R. B.; Zabler, E.
Methoden der zerstörungsfreien Prüfung
In: Handbuch der Mess- und Automatisierungstechnik in der Produktion. Hrsg. H. J. Gevatter,
U. Grünhaupt, Springer-Verlag Heidelberg (2006) 364-410

Bergmann, R. B. (Editor)
Growth, characterization and electronic applications of Si-based thin films
Research Signpost Trivandrum (2002)

Bergmann, R. B.
Crystalline Si films on foreign substrates for electronic applications
In: Recent Res. Devel. Crystal Growth Res.,
Managing Editor: S. G. Pandalai, Transworld Research Network, Vol. 1 (1999) 241-256

Werner, J. H.; Bergmann, R. B.; Brendel, R.
The challenge of crystalline thin film silicon solar cells
In: Festkörperprobleme / Advances in Solid State Physics 34. Hrsg.: R. Helbig, Vieweg Braunschweig (1994) 115-146

 

Recent invited talks

Computational optical metrology
Bergmann, R. B., Falldorf, C.; Klein, Th.; Agour, M.
International Conference on Optical and Photonic Engineering (icOPEN 2016), Chengdu, China (27.09.2016)

Optical metrology for micro-parts
Bergmann, R. B.; Agour, M.; Falldorf, C.
DSPE Optics and Optomechatronics Symposium, Delft (28.09.2015)

Precision optical metrology without lasers
Bergmann, R. B.; Burke, J.; Falldorf, C.
Proc. Of SPIE 9524, International Conference on Optical and Photonics Engineering (icOPEN 2015),
Singapore (15.04.2015)

 

 

Publications

2017

Speckle noise reduction in single-shot holographic two-wavelength contouring
Agour, M. ; Klattenhoff, R. ; Falldorf, C. ; Bergmann, R. B.
Proc. SPIE 10233, Holography: Advances and Modern Trends V, 102330R (2017); doi:10.1117/12.2264971

Sparse light fields in coherent optical metrology
Falldorf, C.; Hagemann, J.-H.; Ehret, G.; Bergmann, R. B.
Appl. Opt. 56 (13), (2017)

2016
Inspektion im Inneren von Mikrotiefziehbauteilen mittels digitaler Holografie
Simic, A; Falldorf, C; Bergmann, R. B.
Laser Magazin 4 (2016) 31

Holographic display system for dynamic synthesis of 3D light fields with increased space bandwidth product
Agour, M.; Falldorf, C.; Bergmann, R. B.
Optics Express 24, 13 (2016) 14393-14405

Shape measurements of microscopic objects using computational shear interferometry
Agour, M.; Falldorf, C.; Bergmann, R. B.
Proc. of SPIE Vol. 9718, Quantitative Phase Imaging II, eds. G. Popescu, YK Parc. SPIE (2016) 97182M-1-8

Quantitative phase contrast imaging using a Nomarski microscope with variable shear distance
Falldorf, C.; Agour, M.; Kötter, J.; Bergmann, R. B.
Proc. of SPIE Vol. 9718. SPIE Digital Library (2016) 97182I-1-7

Realization of a shearing interferometer with LED multipoint illumination for form characterization of optics
Hagemann, J.-H.; Ehret, G.; Bergmann, R. B.; Falldorf, C.
DGaO Proceedings (2016) paper 20

Referenceless phase holography, a new 3D display method
Kreis, T.; Bergmann, R. B.
Proc. Digital Holography & Three -Dimensional Imaging, Heidelberg (2016) OSA
Technical Digest on Imaging and Applied Optics (2016) DTh4E.4 (online)

1 kHz 3.3 ìm Nd:YAG KTiOAsO4 optical parametric oscillator system for laser ultrasound excitation of carbon fiber-reinforced plastics
Puncken, O.; Mendoza Gandara, D.; Damjanic, M.; Mahnke, P.; Bergmann, R. B.; Kalms, M.; Peuser, P.; Wessels, P.; Neumann, J.; Schnars, U.
Applied Optics 55, 6 (2016) 1310-1317

Internal inspection of micro deep drawing parts using digital holography
Simic, A.; Falldorf, C.; Bergmann, R. B.
Proc. Digital Holography & Three -Dimensional Imaging, Heidelberg (2016) OSA
Technical Digest on Imaging and Applied Optics (2016) DW1H.3 (online)

2015
Precision optical metrology without lasers
Bergmann, R. B.; Burke, J.; Falldorf, C.
Proc. SPIE 9524, 952403-1-8 (2015) doi: 10.1117/12.2183451

Running droplet optical multiplexer
Brandhoff, L.; Akhtar, M.; Bülters, M.; Bergmann, R. B.; Vellekoop, M. J.
Optofluidics, Microfluidics and Nanofluidics 1 (2015) 62-68

Light diffraction experiments with micron-sized models of 3D-crystals
Birkenstock, J; Parsi Sreenivas, V; Bergmann, R B; Fischer, R
23nd Annual Conference of the German Crystallographic Society (DGK), Göttingen (16 – 19 March 2015)

A rapid prototyping framework for nano-photonic accelerators
Büter, W; Garcia-Ortiz, A; Ali, A; Mahmood, S; Arefin, S; Parsi Sreenivas, V; Bergmann, R B
Proc. of the 25th International Conference on Field Programmable Logic and Applications (FPL 2015)

A framework for the emulation and prototyping of nano-photonic optical accelerators
Büter, W.; García-Ortiz, A.; Ali, A.; Mahmood, S.; Arefin, S.; Parsi Sreenivas, V.; Bergmann, R. B.
Design, Automation & Test in Europe (DATE Conference 2015)

Single shot lateral shear interferometer with variable shear
Falldorf, C.; Klattenhoff, R.; Bergmann, R. B.
Optical Engineering 54, 5 (2015) 054105-1-6

Digital holography and quantitative phase contrast imaging using computational shear interferometry
Falldorf, C.; Agour, M.; Bergmann, R. B.
Optical Engineering Vol. 54, No. 2 (2015) 024110-1-7

Röntgen-Computertomograf für zerstörungsfreie Prüfung
Kalms, M.; Bergmann, R. B.
Laser Magazin 1 (2015) 39

Dynamic wave field synthesis: enabling the generation of field distributions with a large space-bandwidth product
Kamau, E., Heine, J., Falldorf, C., Bergmann, R. B.
Opt. Express 23, 28920-28934 (2015).

 

2014

Measuring the complex amplitude of wave fields by means of phase retrieval using partially coherent illumination
Agour, M.; Elshaffey, K.; v. Koyplow, C.; Bergmann, R. B.; Falldorf, C.
Proc. of the 7th International Workshop on Advanced Optical Metrology (Fringe 2013), ed. W. Osten. Springer-Verlag Berlin-Heidelberg (2014) 283-287

Nanophotonics in three dimensions: Heading from microelectronics towards optical computing
Bergmann, R. B., Parsi Sreenivas, V. V., Bülters, M., Garcia-Ortiz, A., Gutowski, J. and Lang, W.,
2nd Internat. Conf. on System-Integrated Intelligence (SysInt 2014), Bremen, 2.7.2014

Optical metrology on the micro and nano scale (Keynote)
Bergmann, R. B., Burke, J., Huferath-von Luepke S. and Falldorf C.
4th Internat. Conf. on Nanomanufacturing (NanoMan 2014), Bremen, 8.7.2014

Vom Elektron zum Photon – Paradigmenwechsel in der Signal- und Datenverarbeitung
Bergmann, R. B.
3. Mikrosystemtechnik-Tag, Bremen, 14.5.2014

Subsurface modification of crystalline silicon via ultra-short laser pulses for three dimensional separation
Bülters M.; Parsi Sreenivas, V. V.; Braun, A.; Teubner, U.; Bergmann, R. B.
Proceedings of the 4th International Conference on Nanomanufacturing (nanoMan2014) 08.-10.07.2014 Bremen (CD-Rom)

3D DOEs in photosensitivem Foturan Glas
Bülters, M.; Kamau, E. N.; Parsi Sreenivas, V. V.; Falldorf C. Bergmann, R. B.
115. Jahrestagung der DGaO, Karlsruhe (11.06.2014)

Measurement of mould tool for laminar-flow carbon-fibre composite airplane wing cover
Burke, J.; Gesierich, A.; Li, W.; Bergmann, R. B.
Proc. Oldenburger 3D-Tage 2014, eds.: Luhmann, Müller. Wichmann Berlin (2014) 116-125

Messung eines Formwerkzeugs für einen Kohlefaser-Laminartragflächendeckel
Burke, J.; Gesierich, A.; Li, W.; Bergmann, R. B.
Oldenburger 3D-Tage (13.02.2014)

Precise optical metrology using computational shear-interferometry and an LCD monitor as light source
Falldorf, C.; Simic, A.; Ehret, G.; Schulz, M.; v. Koyplow, C.; Bergmann, R. B.
Proc. of the 7th International Workshop on Advanced Optical Metrology (Fringe 2013), ed. W. Osten. Springer-Verlag Berlin-Heidelberg (2014) 729-734

Calibration of a digital holographic microscope for wear detection
Huferath-von Lüpke, S.;Schröder, M.; Huke, P.; Bergmann, R B.
4th International Conference on Nanomanufacturing – nanoMan 2014, Bremen/Germany (10.07.2014)

Deflectometry vs. Shearography for detection of subsurface defects
Huke, P.; Burke, J.; Bergmann, R. B.
Interferometry XVII: Techniques and Analysis. SPIE Optics & Photonics, San Diego/USA (18.08.2014)

Advanced wave field sensing using Computational Shear Interferometry
Falldorf, C.; Agour, M.; Bergmann, R. B.
Proc. of the SPIE Interferometry XVII: Advanced Applications. SPIE Bellingham Vol. 9204 (2014) 92040C-1-9

Complete shape measurement of micro parts by digital holography
Huferath-von Luepke, S., Klattenhoff, R., Dankwart, C., Falldorf, C., Bergmann R.B.
Proc. of SPIE; Interferometry XVI: Techniques and Analysis, eds.: K. Creath, J. Burke, J. Schmit. SPIE Bellingham (2014) 920302-1-8

Digital holography for inline wear recording on deep drawing tools
Huferath-von Luepke, S.; Bergmann, R. B.
Proceedings of the 4th International Conference on Nanomanufacturing (nanoMan2014) 08.-10.07.2014 Bremen (CD-Rom)

Efficient laser generation of Lamb waves
Huke, P.; Schröder, M.; Hellmers, S.; Kalms, M.; Bergmann, R.B.
Optics Letters 39, (2014) 5795-5797

Beam shaping using liquid crystal-on-silicon spatial light modulators for laser ultrasound generation
Kalms, M.; Hellmers, S.; Huke, P.; Bergmann, R. B
Optical Engineering 53/4 (2014) 044110-1-6

Fabrication of 3D DOEs in photosensitive Foturan Glass
Kamau, E. N.; Bülters, M.; Sanchez Alvarez, C.; Parsi Sreenivas, V. V.; Falldorf, C.; Bergmann, R. B.
4th International Conference on Nanomanufacturing – nanoMan 2014, Bremen/Germany (08.07.2014)

Surface characterization by structure function analysis
Kreis, Th.; Burke, J.; Bergmann, R. B.
J. Europ. Opt. Soc. Rap. Public 9 (2014) 14032-1-8

Optical Vector Matrix Multiplier for On-Chip Computation
Parsi Sreenivas, V. V; Bülters, M.; Dumstorff, G; Chauhan, A; Garcia-Ortiz, A; Bergmann, R. B.
European Optical Society Annual Meeting (EOSAM 2014) Berlin (CD-Rom)

Optical waveguides via laser micro machining
Parsi Sreenivas, V. V.; Bülters, M.; Morosov, K.; Bergmann, R. B.
Proceedings of the 4th International Conference on Nanomanufacturing (nanoMan2014) 08.-10.07.2014 Bremen (CD-Rom)

Three dimensional fabrication of optical waveguiding elements for on-chip integration
Parsi Sreenivas, V.; Bülters, M. Schröder, M.; Bergmann, R. B.
Proc. of SPIE – Micro-Optics 2014, eds.: H.Thienpont, J. Mohr, H. Zappe, H. Nakajima. SPIE Bellingham WA (2014) 91300M1-7

Improving the Generic Camera Calibration technique by extended model of calibration display
Reh, T.; Li, Wansong; Burke, J.; Bergmann, R.B.
J. Europ. Opt. Soc. Rap. Public 9 (2014) 14044-1-4

Axially distributed sensing with a monoscopic imaging lens for single-shot distance measurements
Sandner, M.; Kolenović, E.; Klattenhoff, R.; Kolenović, E.; Elandaloussi, F.; v. Kopylow, C.; Bergmann, R. B.
Applied Optics 53/22 (2014) 5078 – 5083

Fabrication of 3d-microstructures for calibration of a holographic metrology system
Schröder, M.; Huferath-von Luepke, S.; Bülters, M.; Bergmann, R. B.
Proceedings of the 4th International Conference on Nanomanufacturing (nanoMan2014) 08.-10.07.2014 Bremen (CD-Rom)

Dimensional Quality Inspection of Metallic Micro Components in Micro Bulk Manufacturing
Weimer, D.; Huferath-v. Lüpke, S.; Tausendfreund, A.; Lübke, K.; Falldorf, C.; Lütjen, M.; von Freyberg, A.; Bergmann, R B.; Goch, G.; Scholz-Reiter, B.
Advanced Materials Research Vol. 1018. TransTechn Publications Switzerland (2014) 493-500

A Comparison of in-situ Measuring Systems within Micro Cold Forming
Weimer, D., Huferath-von Lüpke, S., Falldorf, C., Lütjen, M., Tausendfreund, A., Kreis, Th., von Freyberg, A., Bergmann, R.B., Goch, G., Scholz-Reiter, B.
Proceedings of the 4th International Conference on Nanomanufacturing (nanoMan2014) 8 – 10 July, 2014, Bremen (CD-Rom)

2013

Phase retrieval using constrains derived from the Helmholtz equation
Agour, M.; Kolenovic, E.; Falldorf, C.; v. Kopylow, C.; Jüptner, W.; Bergmann, R.B.
Computational Optical Sensing and Imaging (COSI-2013); OSA Technical Digest, Optial Society of America (2013) CTu3C.3

Investigation of composite materials using SLM-based phase retrieval   Direct link
Agour, M.; Falldorf, C.; Bergmann, R. B.
Optics Letters Vol. 38, No. 13 (2013) 2203-2205

Nanophotonics and microelectronics: Heading towards optical computing
Bergmann, R. B., Garcia-Ortiz, A.; Gutowski, J.; Lang. W.,
BIT’s 3rd Annual World Congress of Nanoscience and Nanotechnology Xi’an/China, 27.9.2013

Advanced optical metrology for quality control (invited talk)
Bergmann, R. B.
Lasers in Manufacturing (LIM 2013), München (13.05.2013)

Nanophotonics and microelectronics: Heading towards optical computing (invited talk)
Bergmann, R. B., Garcia-Ortiz, A.; Gutowski, J.; Lang. W.
BIT’s 3rd Annual World Congress of Nanoscience and Nanotechnology Xi’an/China (27.9.2013)

Qualifying parabolic mirrors with deflectometry    Direct link
Burke, J.; Li, W.; Heimsath, A.; v. Kopylow, C.; Bergmann, R.B.
J. Europ. Opt. Soc. Rap. Public 8 (2013) 13014-1-6

Wave field sensing by means of computational shear interferometry    Direct link
Falldorf, C.; v. Kopylow, C.; Bergmann, R. B.
Journal of the Optical Society of America A, Vol. 30 (10) (2013) 1905-1912

Computational shear interferometry for digital holography
Falldorf, C.; Bergmann, R. B.
SPIE Newsroom (2013) nur online

Novel trends in optical non-destructive testing methods    Direct link
Huke, P., Klattenhoff, R.; v. Kopylow, C. Bergmann, R. B.
J. Europ. Opt. Soc. Rap. Public, 8, 13043 (2013) 1-7

Nondestructive testing in an automated process chain for mass manufacturing of fiber reinforced thermoplastic components
Kalms, M.; Hellmers, S.; v. Kopylow, C.; Bergmann, R. B.,
SPIE Conference on Nondestructive Characterization for Composite Materials, Aerospace, Engineering, Civil Infrastructure, and Homeland Security VI, eds.: T Y. Yu, A. L. Gyekenyesi, P. J.Shull,A. A. Diaz, H. F. Wu. SPIE Bellingham (2013) 869429-1-9

Least-square based inverse reconstruction of in-line digital holograms
Kamau, E. N.; Burns, N.; Falldorf, C.; v. Kopylow, C.; Watson, J; Bergmann, R. B.
Journal of Optics 15 (2013) 075716

A new approach to dynamic wave field synthesis using computer generated volume holograms
Kamau, E. N., Falldorf, C., Bergmann, R. B.
Information Optics WIO (2013) 12th Workshop on. IEEE Xplore Tenerife/Spain (2013)1-3 (online)

Digital holographic system for the imaging and analysis of living marine plankton interrelational behavior
Kamau, E.N. ; Huke, P.; Bergmann, R. B.
3rd EOS Topical Meeting (on Blue Photonics – Optics in the Sea (2013) o.S.

Non-equilibrium Grain Size Distribution with Generalized Growth and Nucleation Rates
Lokovic, K. S.; Bergmann, R. B.; Bill, A.
J. Mater. Res., Vol. 28, No. 11 (2013) 1407-1412

Vision ray camera calibration for small field of view
Reh, T; Li, W; Gesierich, A; Bergmann, R. B.
DGaO-Proceedings 2013 (online)

Areal absolute form measurement of optical surfaces using phase measuring deflectometry and shearing interferometry
Sandner, M.; Falldorf, C.; Simic, A.; Burke, J.; Bergmann, R. B.
Proc. 6th High Level Expert Meeting on Asphere Metrology, Braunschweig (2013) (CD)

 

2012

Misalignment compensation in spatial light modulator based optical filtering techniques
Agour, M.; Falldorf, C.; v. Koyplow, C.; Bergmann, R. B.
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Design of diffractive optical elements for multiple wavelength image formation by gradient-based methods
Dankwart, C.; Falldorf, C.; v. Kopylow, C.; Bergmann, R.B.
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Three dimensional optical components on IC surfaces for on-chip communication
Bülters, M.; Schröder, M.; Bergmann, R. B.
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Reduction of speckle noise in multi wavelength contouring     Direct link
Falldorf, C.; Huferath-von Luepke, S.; v. Kopylow, C.; Bergmann, R. B.
Applied Optics 51, 8211-8215 (2012)

Holographic imaging utilizing pulsed ultra violet lasers and diamond-turned diffractive optical elements
Kibben, S.; Koerdt, M.; Dankwart, C.; Bergmann, R. B.; Vollertsen, F.
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Non-destructive testing of carbon reinforced plastics by means of phase retrieval
Agour, M.; Falldorf, C.; v. Kopylow, C.; Bergmann, R. B.
V International Conference on Speckle Metrology (Speckle 2012), eds.: A. F.Doval, C. Trillo, J. C. Lopez-Vazquez. SPIE
Bellingham (2012) 841318-1-5

A fast and robust approach to phase shift registration from randomly phase shifted interferograms
Hildebrand, A.; Falldorf, C.; v. Kopylow, C.; Bergmann, R. B.
Proc. SPIE, Vol. 8413. SPIE Bellingham (2012) 84130R

Design and simulation of three-dimensional optical polymer waveguide devices for photonic on-chip application
Schröder, M.; Bülters, M.; Bergmann, R. B.
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Non-linear optimization for the reconstruction of wavefronts from gradient data
Falldorf, C.; Li, W.; v. Kopylow, C.; Bergmann, R. B.;
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Comparative digital holographic microscope for wear detection at micro deep drawing tools
Huferath-von Lüpke, S., Zuch, U., Huke, P., v. Kopylow, C., Bergmann, R. B.
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Optical non-destructive testing methods
Huke, P., v. Kopylow, C. Bergmann, R. B.
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Laser-generated ultrasound with liquid crystal on silicon (LCoS) technology in the thermoelastic regime
Kalms, M.; Hellmers, S.; Bergmann, R. B.
Nondestructive Characterization for Composite Materials, Aerospace Engineering, Civil Infrastructure, and Homeland Security (2012) eds.: A. L. Gyekenyesi, T.-Y. Yu, P. J. Shull, A. A. Diaz, H. F. Wu. SPIE Bellingham/Washington (2012) 83470N1-9

Point Source Based Model for the Inverse Numerical Reconstruction of Digital Holograms
Kamau, E. N.; Wang, N.; Falldorf, C.; v. Kopylow, C.; Bergmann, R. B.
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Qualifying parabolic mirrors with deflectometry
Li, W.; Heimsath, A.; Burke, J.; v. Kopylow, C.; Bergmann, R. B.
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Microsized subsurface modification of mono-crystalline silicon via non-linear absorption    Direct link
Parsi Sreenivas, V. V., Bülters, M., Bergmann, R. B.
J. Europ. Opt. Soc. Rap. Public 7 (2012) 12035-1-5

Subsurface modification in mono-crystalline silicon by multiphoton processes – analytical model and first results
Parsi Sreenivas, V. V., Bülters, M., Bergmann, R. B.
EOS Annual Meeting Aberdeen (2012) ISBN 978-3-9815022-4-4 (CD Rom)

Messen und Prüfen mit Licht
Sandner, M.; Burke, J.; v. Kopylow, C.; Bergmann, R. B.
Werkstattstechnik online, 11/12 (2012) 777-782

Novel concept for three-dimensional polymer waveguides for Optical on-Chip Interconnects    Direct link
Schröder, M.; Bülters, M.; v. Kopylow, C.; Bergmann, R. B.
J. Europ. Opt. Soc. Rap. Public.7 (2012) 12027-1-4

Wear recording at micro deep drawing tools with comparative digital holography    Direct link
Huferath-von Lüpke, S., Huke, P., v. Kopylow, C., Bergmann, R.B.
J. Europ. Opt.Soc. Rap. Public 7 (2012) 12041-1-7

Phase Retrieval for Optical Inspection of Technical Components
Falldorf, C.; Agour, M.; v. Kopylow, C.; Bergmann, R. B.
J. Opt. 14 (2012) 065701

 

2011

Wear recording at micro deep drawing tools with comparative digital holography
S. Huferath-von Lüpke, P. Huke, C. von Kopylow, Ralf B. Bergmann,
Proceedings 1st EOS Topical Meeting on Micro- and Nano-Optoelectronic systems, 7.-9.12.2011, Bremen (CD-ROM), ISBN 978-3-00-033711-6 (2011)

Novel concept for three-dimensional polymer waveguides
M. Schröder, V. V. Parsi Sreenivas, C. von Kopylow, Ralf B. Bergmann
Proceedings 1st EOS Topical Meeting on Micro- and Nano-Optoelectronic systems, 7.-9.12.2011, Bremen (CD-ROM), ISBN 978-3-00-033711-6 (2011)

Novel three-dimensional Polymer Waveguides for Optical on-Chip Interconnects
M. Bülters, M. Schröder, C. von Kopylow, Ralf B. Bergmann,
Proceedings 1st EOS Topical Meeting on Micro- and Nano-Optoelectronic systems, 7.-9.12.2011, Bremen (CD-ROM), ISBN 978-3-00-033711-6 (2011)

Nanosized subsurface modification of mono-crystalline Silicon via non-linear absorbtion
V. V. Parsi Sreenivas, M. Bülters, C. von Kopylow, Ralf B. Bergmann
Proceedings 1st EOS Topical Meeting on Micro- and Nano-Optoelectronic systems, 7.-9.12.2011, Bremen (CD-ROM), ISBN 978-3-00-033711-6 (2011)

Automated compensation of misalignment in phase retrieval based on a spatial light modulator    Direct link
M. Agour, C. Falldorf, C. von Kopylow, Ralf B. Bergmann
Applied Optics 50, pp. 4779-4787 (2011)

The effect of misalignment in phase retrieval based on a spatial light modulator
M. Agour, C. Falldorf, C. von Kopylow, Ralf B. Bergmann
Proceedings SPIE Optical Metrology Munich – Optical Measurement Systems for industrial inspection, Vol. 8082, ed.: SPIE, p. 80820M-1: 80820M-10 (2011)

Schnelle 3D-Formerfassung von Mikrotiefziehbauteilen mittels digitaler Holografie
N. Wang, C. von Kopylow, C. Falldorf, Ralf B. Bergmann
Photonik 4/ 2011, S. 40-42 (2011)

Assessment of digital holography for 3D-shape measurement of micro deep drawing parts in comparison to confocal microscopy
N. Wang, C. Falldorf, C. von Kopylow and Ralf B. Bergmann,
MEMS and Nanotechnology, Vol. 4: Proceedings of the 2011 Annual Conference Proceedings of the Society for Experimental Mechanics (SEM), Ed.: Tom Proulx, Springer, Berlin (2011)

Development of the grain size distribution during the crystallization of an amorphous solid
A. Bill, Ralf B. Bergmann
Mater. Res. Soc. Symp. Proc. Vol. 1308, 2011 Materials Research Society, DOI: 10.1557/opl.2011.506 (2011)

Contactless defect detection using optical methods for non destructive testing NdT
Ph. Huke, O. Focke, C. Falldorf, C. von Kopylow, Ralf B. Bergmann, Proceedings of the 2nd Symposium on NDT in Aerospace 2010 (CD-ROM), (2011)

 

2010

Resolution enhancement by time-multiplexed acquisition of sub-pixel shifted images employing a spatial light modulator
A. Hildebrand, C. Falldorf, C. von Kopylow, Ralf B. Bergmann,
Proceedings International Symposium on Optomechatronic Technologies (ISOT 2010), eds.: F. Janabi-Sharifi and J. Kofman, IEEE (2010), pp. 1-6, DOI: 10.1109/ISOT.2010.5687353 (CD-ROM)

Measurement of thermally induced deformations by means of phase retrieval
C. Falldorf, M. Agour, C. von Kopylow, Ralf B. Bergmann, Proceedings International Symposium on Optomechatronic Technologies (ISOT 2010), eds.: F. Janabi-Sharifi and J. Kofman, IEEE (2010), pp. 1-5, DOI: 10.1109/ISOT.2010.5687376 (CD-ROM)

Liquid crystal spatial light modulators in optical metrology
C. Falldorf, C. von Kopylow, Ralf B. Bergmann
Invited Paper, Information Optics (WIO), 2010 9th Euro-American Workshop on Information Optics, Helsinki, eds.: T. J. Naughton, B. Javidi, IEEE (2010), pp. 1-3, DOI: 10.1109/WIO.2010.5582527 (CD-ROM)

Vision ray calibration for the quantitative geometric description of general imaging and projection optics in metrology    Direct link
Th. Bothe, W. Li, M. Schulte, C. von Kopylow, R. B. Bergmann, W. P. O. Jüptner
Applied Optics 49, pp 5851-5860 (2010)

Optical metrology and optical non-destructive testing from the perspective of object characteristics
Ralf B. Bergmann, T. Bothe, C. Falldorf, P. Huke, M. Kalms, C. von Kopylow
Invited Paper, Proceedings SPIE Interferometry XV: Applications, Vol. 7791, p. 1-15, Bellingham, WA., USA (2010)

Grain size distribution in crystallization processes with anisotropic growth rate
Andreas Bill, K. S. Lokovic, Ralf B. Bergmann
MRS Spring Meeting, Symposium A, Vol. 1245 (2010), 1245-A16-07 (online)

Time evolution of the grain size distributions in random nucleation and growth crystallization processes
Anthony V. Teran, Andreas Bill, Ralf B. Bergmann.
Physical Review B 81(2010) 075319-1-19

Design of an optical system for phase retrieval based on a spatial light modulator
C. Falldorf, M. Agour, C. von Kopylow, Ralf B. Bergmann
in: Proceedings on „Advanced Phase Measurement Methods in Optics and Imaging“, Locarno, Switzerland (2010), p. 259-264

Digital alignment of a reconstructed hologram with an object for measurement of deterioration of tools
S. Huferath-von Lüpke, T. Baumbach, E. Kolenovic, C. Falldorf, C. v. Kopylow, Ralf B. Bergmann
in: Proceedings 36th Internat. MATADOR Conference 2010, eds.: S. Hinduja, L. Li, Springer Verlag London (2010), p. 331-334

Modeling of the optical behavior of diamond turned holograms
C. Dankwart, C. Falldorf, C. von Kopylow, Ralf B. Bergmann
in: Proceedings EOS Topial Meeting on Diffractive Optics 2010-EOS 2010 (CD-ROM)

Phase retrieval by means of a spatial light modulator in the fourier domain of an imaging system    Direct link
C. Falldorf, M. Agour, C. von Kopylow, Ralf B. Bergmann
Applied Optics 49/10 (2010), p. 1826-1830

Design of a diamond turned hologram incorporating properties of the fabrication process    Direct link
C. Dankwart, C. Falldorf, R. Gläbe, B. Lünemann, C. von Kopylow, Ralf B. Bergmann
Applied Optics 49 (2010), 4949-4955

 

2009

Measurement of Optical Components
Ralf B. Bergmann, Th. Bothe, C. Falldorf, C. von Kopylow
in: Proc. Internat. Molded Optics Conference 2009 (iMOC 2009)

Modeling the Grain Size Distribution during Solid Phase Crystallization of Silicon
Andreas Bill, Anthony V. Teran, Ralf B. Bergmann
Mater. Res. Soc. Symp. Proc. Vol. 1153 (Materials Research Society, 2009), 1153-A05-03

Holographic projection based on Diamond Turned Diffractive Optical Elements    Direct link
C. Falldorf, C. Dankwart, R. Gläbe, B. Lünemann, C. von Kopylow, Ralf B. Bergmann
Applied Optics 48 (2009), p. 5782-5785

Modeling the Grain Size Distribution during Solid Phase Crystallization of Silicon
A. Bill, Anthony V. Teran, Ralf B. Bergmann
Mater. Res. Soc. Symp. Proc. 1153 (Materials Research Society) (2009), 1153-A05-03

The Fringe Reflection Technique for Lens Inspection and Specular Freeform Measurement
T. Bothe, W. Li, C. von Kopylow, Ralf B. Bergmann
MAFO Ophthalmic Labs & Industry 5 (2009), p. 38-42

Lateral Shearing Interferometer based on a Spatial Light Modulator in the Fourier Plane
C. Falldorf, R. Klattenhoff, A. Gesierich, C. von Kopylow, R. B. Bergmann
in: Proc. FRINGE 2009 – The 6th International Workshop on Advanced Optical Metrology, p. 93 – 98 (2009)

 

2008

On the origin of logarithmic-normal distributions: An analytical derivation, and its application to nucleation and growth processes
Ralf B. Bergmann, Andreas Bill
J. Crystal Growth 310/13, 3135-3138 (2008)

On the logarithmic-normal distribution in nucleation and growth processes
Andreas Bill, Anthony Teran, Ralf B. Bergmann
APS-Spring Meeting 2008, Abstract only

 

2006

Non-Destructive Testing in the Automotive Supply Industry – Requirements, Trends and Examples Using X-ray CT“ (invited paper)
Ralf B. Bergmann, Florian T. Bessler and Walter Bauer
in: 9th Europ. Conf. for Non-Destructive Testing, Berlin, September 25 – 29, 2006, DGZFP Proceedings BB 103-CD, Th.1.6.1
2004

Computer tomography for non-destructive testing in the automotive industry
Walter Bauer, Florian T. Bessler, Erich Zabler and Ralf B. Bergmann
in: SPIE Conference, Denver, USA, August 2004, Session 12, Materials Research II, Talk No. 5535-50

 

2003

Röntgen-Computertomographie in der industriellen Fertigung – Anwendungen und Entwicklungsziele
E. Zabler, M. Rosenberger-Koch und R. B. Bergmann
in: Jahrestagung der Dt. Gesellschaft für zerstörungsfreie Prüfung (DGZFP), Tagungsband auf CD-ROM (DGZFP, 2003), V 17

Low-temperature epitaxy on polycrystalline silicon substrates
T. A. Wagner, L. Oberbeck, R. B. Bergmann, M. Nerding, H. P. Strunk and J. H. Werner
Solid State Phenomena 93, 121 (2003)

Single to polycrystalline transition in silicon growth by ion assisted deposition at low temperatures
M. Nerding, L. Oberbeck, T. A. Wagner, R. B. Bergmann and H. P. Strunk
J. Applied Physics 93, 2570 (2003)

 

2002

„Growth, characterization and electronic applications of Si-based thin films“
Volume Editor: Ralf B. Bergmann (Research Signpost, Trivandrum, India, 2002).
Contributions:
„Thin film transistors for flexible electronics“ by S. Wagner, H. Gleskova, I. Chun Cheng and M. Wu;
„Nucleation and growth dynamics in polycrystalline Si (SiGe) thin films formation“ by H. Kumomi;
„Laser crystallization of Si and SiGe films“ by J. R. Köhler;
„Solid phase crystallization of Si and Ge:“ by H. Atwater and C. M. Chen;
„Zone melting recrystallization of Si films for solar cells“ by T. Ishihara;
„Thin film Si-based opto¬electronics“ by S. Pizzini and S. Binetti;
„Low temperature epitaxial growth of Si and SiGe films“ by L. Oberbeck;
„High temperature deposition and epitaxy of Si and SiGe“ by A. Slaoui, J. Poortmans and M. Caymax;
„Transfer of monocrystalline Si films for thin film solar cells“ K. J. Weber, M. Stocks, A. W. Blakers and M. McCann;
„Transfer of monocrystalline Si films for silicon on insulator devices“ N. Sato, K. Ohmi, and T. Yonehara;
„Thin semiconductor films: Future trends“ by H.-J. Queisser

Advances in Monocrystalline Si Thin Film Solar Cells by Layer Transfer
R. B. Bergmann, C. Berge, T. J. Rinke, J. Schmidt, and J. H. Werner
Solar Energy Materials & Solar Cells 74, 213 (2002)

The Future of Crystalline Silicon Films on Foreign Substrates
R. B. Bergmann and J. H. Werner
Thin Solid Films 403-404, 162-169 (2002)

Optimization and characterization of amorphous/crystalline silicon heterojunction solar cells
N. Jensen, R. M. Hausner, R. B. Bergmann, J. H. Werner, and U. Rau
Prog. Photovolt. Res. & Appl. 10, 1-13 (2002)

Low temperature epitaxial Silicon films deposited by ion-assisted deposition
T. A. Wagner, L. Oberbeck, and R. B. Bergmann
Mat. Sci. Eng. B 89, 319 (2002)

Monocrystalline Si Thin Film Solar Cells by Layer Transfer
C. Berge, R. B. Bergmann, T. J. Rinke, and J. H. Werner
Proc. 17th Europ. Photov. Solar Energy Conf., B. McNelis, W. Palz, H. A. Ossenbrink, and P. Helm, Eds. (WIP Munich, Germany, 2002), p. 1277

Application of plasma silicon nitride to crystalline thin-film silicon solar cells
J. Schmidt, L. Oberbeck, T. J. Rinke, C. Berge, R. B. Bergmann
in Proc. 17th Europ. Photov. Solar Energy Conf., B. McNelis, W. Palz, H. A. Ossenbrink, and P. Helm, Eds. (WIP Munich, Germany, 2002), p. 1351

 

2001

High rate deposition of epitaxial layers for efficient low temperature thin film epitaxial silicon solar cells
L. Oberbeck, J. Schmidt, T. Wagner, and R. Bergmann
Prog. Photovolt. Res. Appl. 9, 333 (2001)

Orientation-Dependence of Low Temperature Epitaxiasl Silicon Growth
T. A. Wagner, L. Oberbeck, M. Nerding, H. P. Strunk and R. B. Bergmann
Mat. Res. Soc. Symp. Proc. 664, A22.3 (2001)

Crystalline Silicon Thin Film Solar Cells
Jürgen H. Werner and Ralf B. Bergmann
in Techn. Digest 12th Int. Photovolt. Science and Engineering Conf. (Kyung Hee Information Printing, Seoul, 2001), p. 69

Monocrystalline Si Films from Transfer Processes for Thin Film Devices
Ralf B. Bergmann, Christopher Berge, Titus J. Rinke, and Jürgen H. Werner
Mat. Res. Soc. Symp. Proc. 685E, D2.1 (2001)

Intra grain defects – limiting factor for low temperature polycrystalline silicon films
T. A. Wagner, L. Oberbeck, R. B. Bergmann, J. H. Werner
Solid State Phenom. 80-81, 95 (2001)

High-quality and low-temperature epitaxial Si films deposited at very high deposition rate
R. B. Bergmann, L. Oberbeck, and T. A. Wagner
J. Crystal Growth 225, 335 (2001)

From polycrystalline to single crystalline silicon on glass
J. H. Werner, R. Dassow, T. J. Rinke, J. R. Köhler, and R. B. Bergmann
Thin Solid Films 383, 95(2001)
Thin film solar cells on glass based on the transfer of monocrystalline Si films
R. B. Bergmann, T. J. Rinke, T. A. Wagner, and J. H. Werner
Solar Energy Materials & Solar Cells 65, 355 (2001)

 

2000

Ion-assisted deposition of silicon epitaxial films with high deposition rate using low energy silicon ions
Lars Oberbeck, Thomas A. Wagner, and Ralf B. Bergmann
Mat. Res. Soc Symp. Proc. 609, A7.1.1 (2000)

Ions allow silicon growth to keep its cool
L. Oberbeck and R. B. Bergmann
Vacuum Solutions 18, 31 (2000)

Efficient thin film solar cells by transfer of monocrystalline Si layers
T. J. Rinke, R. B. Bergmann and J. H. Werner
in: Proc. 16th European Photovoltais Solar Energy Conference, Eds.: H. Scheer, B. McNelis, W. Palz, H. A. Ossenbrink and P. Helm (James & James Science Publishers Ltd., London, 2000), p. 1128

Perspectives of crystalline Si thin film solar cells: A new era of thin monocrystalline Si-films?
R. B. Bergmann and T. R. Rinke
Prog. Photovolt.: Res. Appl. 8, 451 (2000)

Solarzellen und Mikrochips von morgen
R. B. Bergmann, T. J. Rinke and J. H. Werner, Physikalische Blätter, Vol. 56, Nr. 9, 51 (2000)

Monocrystalline Si thin film solar cells: A new era for thin film photovoltaics?
R. B. Bergmann, T. J. Rinke, and J. H. Werner,
in 10th Workshop on Crystalline Silicon Solar Cell Materials and Processes, Ed. B. L. Sopori (NREL, Golden Colorado, 2000), p. 125

Electronic properties of silicon epitaxial layers deposited by ion-assisted deposition at low temperatures
L. Oberbeck and R. B. Bergmann
J. Appl. Phys. 88, 3015 (2000)

Structure and properties of quasi-monocrystalline Si thin films
T. J. Rinke, R. B. Bergmann, and J. H. Werner
Mat. Res. Soc. Symp. Proc. 558, 251 (2000)

Recombination mechanisms in amorphous silicon/crystalline silicon heterojunction solar cells
N. Jensen, U. Rau, R. M. Hausner, S. Uppal, L. Oberbeck, R. B. Bergmann and J. H. Werner
J. Appl. Phys. 87, 2639 (2000)

Low-temperature processing of crystalline Si films on glass for electronic applications
R. B. Bergmann, T. J. Rinke, L. Oberbeck, and R. Dassow
in: Perspectives, Science and Technologies for Novel Silicon on Insulator Devices, Eds.: P. L. F. Hemment, V. S. Lysenko and A. N. Nazarov, NATO Science Series 3. High Technology – Vol. 73 (Kluwer Academic Publishers, Dordrecht, 2000), p. 109

 

1999

Perspectives of Crystalline Silicon Thin Film Solar Cells
J. H. Werner and R. B. Bergmann
in: Technicals Digest 11th Intern. Photov. Science and Engin. Conf., Sapporo (Tokyo University of Agriculture & Technology, Tokyo, 1999), p. 923

Crystalline Si Films on Foreign Substrates for Electronic Applications
R. B. Bergmann
in: Recent Res. Devel. Crystal Growth Res. 1, 241 (1999)

Material Aspects of Crystalline Silicon Thin Film Solar Cells on Glass
R. B. Bergmann
in: 9th Workshop on Crystalline Silicon Solar Cell Materials and Processes (NREL, Golden, Colorado, 1999), p. 94

Thin film solar cells on glass by transfer of monocrystalline Si films
R. B. Bergmann, T. J. Rinke, R. M. Hausner, M. Grauvogl, M. Vetter, and J. H. Werner
International Journal of Photoenergy 1, 83 (1999)

Crystalline Si thin film solar cells: A review
R. B. Bergmann
Applied Physics A 69, 187 (1999)

Quasi-monocrystalline silicon for thin film devices
T. J. Rinke, R. B. Bergmann, and J. H. Werner
Applied Physics A 68, 705 (1999)

Laser-crystallized polycrystalline silicon on glass for photovoltaic applications
R. Dassow, J. R. Köhler, M. Grauvogl, R. B. Bergmann, and J. H. Werner
Solid State Phenomena 67-68, 193 (1999)

Low-temperature silicon-epitaxy by ion-assisted deposition
L. Oberbeck, R. B. Bergmann, N. Jensen, S. Oelting, and J. H. Werner
Solid State Phenomena 67-68, 459 (1999)

Heterojunctions for polycrystalline silicon solar cells
R. M. Hausner, N. Jensen, R. B. Bergmann, U. Rau, and J. H. Werner
Solid State Phenomena 67-68, 571 (1999)

Ultrathin quasi-monocrystalline silicon films for electronic devices
T. J. Rinke, R. B. Bergmann, R. Brüggemann, and J. H. Werner
Solid State Phenomena 67-68, 229 (1999)

Large-grained polycrystalline silicon on glass by copper vapor laser annealing
J. R. Köhler, R. Dassow, R. B. Bergmann, J. Krinke, H. P. Strunk, and J. H. Werner
Thin Solid Films 337, 129 (1999)

 

1998

High rate, low-temperature deposition of crystalline silicon films for thin film solar cells on glass
R. B. Bergmann, R. M. Hausner, N. Jensen, M. Grauvogl, L. Oberbeck, T. Rinke, M. B. Schubert, Ch. Zaczek, R. Dassow, J. R. Köhler, U. Rau, S. Oelting, J. Krinke, H. P. Strunk, and J. H. Werner
in: Proc. 2nd World Conference on Photovoltaic Energy Conversion, eds: J. Schmid, H. A. Ossenbrink, P. Helm, H. Ehmann, E. D. Dunlop (European Commission Ispra, 1998), p. 1260

Light trapping and amorphous/crystalline heterojunctions for silicon thin film solar cells on glass
R. M. Hausner, R. B. Bergmann and J. H. Werner
in: Proc. 2nd World Conference on Photovoltaic Energy Conversion, eds: J. Schmid, H. A. Ossenbrink, P. Helm, H. Ehmann, E. D. Dunlop (European Commission Ispra, 1998), p. 1754

High resolution ebic imaging of polycrystalline silicon solar cells
A. B. Sproul, T. Puzzer, and R. B. Bergmann
in: Proc. 2nd World Conference on Photovoltaic Energy Conversion, eds: J. Schmid, H. A. Ossenbrink, P. Helm, H. Ehmann, E. D. Dunlop (European Commission Ispra, 1998), p. 1355

Low temperature Si-epitaxy with high deposition rate using ion assisted deposition
R. B. Bergmann, C. Zaczek, N. Jensen, S. Oelting, and J. H. Werner
Applied Physics Letters 72, 2996 (1998)

Growth mechanisms in laser crystallization and laser interference crystallization
G. Aichmayr, D. Toet, M. Mulato, P. V. Santos, A. Spangenberg, and R. B. Bergmann
J. Non-Crystalline Solids 227/230, 921 (1998)

Nucleation and Growth of Crystalline Silicon Films on Glass for Solar Cells
R. B. Bergmann, J. Köhler, R. Dassow, C. Zaczek and J. H. Werner
Physica Status Solidi (a) 166, 587 (1998)

Non-coarsening origin of log-normal size distributions during crystallization of amorphous films
R. B. Bergmann, F. G. Shi and J. Krinke
Physical Review Letters 80, 1011 (1998)

Formation of Semiconductors with Log-Normal Grain Size Distributions
R. B. Bergmann, F. G. Shi, H. J. Queisser and J. Krinke
Applied Surface Science 123/124, 376 (1998)

High-efficiency drift-field thin-film silicon solar cells grown on electronically inactive substrates
G. F. Zheng, W. Zhang, Z. Shi, D. Thorp, R. B. Bergmann, M. A. Green
Solar Energy Materials and Solar Cells 51, 95 (1998)

 

1997

Transport analysis for polycrystalline silicon solar cells on glass substrates
R. Brendel, R. B. Bergmann, B. Fischer, J. Krinke, R. Plieninger, U. Rau, J. Reiß, H. P. Strunk, H. Wanka, and J. H. Werner
in: Proc. 26th Photov. Specialists Conf., (IEEE, Picataway, 1997), p. 635

Zone melt recrystallization of silicon films on glass
R. B. Bergmann, C. Hebling, and J. H. Werner
in: Proc. 14th Europ. Photovoltaic Solar Energy Conf., Hrsg. H. A. Ossenbrink, P. Helm, and H. Ehmann (Stephens & Assoc., Bedford, 1997), p. 1464

Polycrystalline Silicon Films on Glass for Solar Cells by Ion-Assisted Deposition
J. Kühnle, R. B. Bergmann, S. Oelting, J. Krinke, H. P. Strunk, J. H. Werner
in: Proc. 14th Europ. Photovoltaic Solar Energy Conf., Hrsg. H. A. Ossenbrink, P. Helm, and H. Ehmann, (Stephens & Assoc., Bedford, 1997), p. 1022

Optical and structural characterization of silicon microstructures fabricated by laser interference crystallization
D. Toet, G. Aichmayr, M. Mulato, P. V. Santos, A. Spangenberg and R. B. Bergmann
Mat. Res. Soc. Symp. Proc. 467, 337 (1997)

Deposition and characterization of polycrystalline silicon films for thin film solar cells on glass substrates“
R. B. Bergmann, J. Krinke, H. P. Strunk, and J. H. Werner
Mat. Res. Soc. Symp. Proc. 467, 352 (1997)

Crystalline silicon films on a novel high temperature glass for applications in microelectronics and photovoltaics
R. B. Bergmann, J. G. Darrant, A. R. Hyde, and J. H. Werner,
J. Non-Cryst. Solids 218, 388 (1997)

Fabrication of single crystalline SiC layer on high temperature glass
Q.-Y. Tong, T.-H. Lee, P. Werner and U. Gösele, R. B. Bergmann and J. H. Werner
J. Electrochem. Soc. 144, L111 (1997)

Large grained polycrystalline silicon films by solid phase crystallization of phosphorus doped amorphous silicon
R. B. Bergmann and J. Krinke
J. Crystal Growth 177, 191 (1997)

Solid phase crystallized Si films on glass substrates for thin film solar cells
R. B. Bergmann, G. Oswald, M. Albrecht and V. Gross
Solar Energy Materials and Solar Cells 46, 147 (1997)

Ultrathin crystalline silicon solar cells on glass substrates
R. Brendel, R.B. Bergmann, P. Lölgen, M. Wolf, and J.H. Werner
Appl. Phys. Letters 70, 390 (1997)

Growth of polycrystalline silicon films on glass by high temperature chemical vapor deposition
R. B. Bergmann, R. Brendel, M. Wolf, P. Lölgen, J. Krinke, H.P. Strunk and J.H. Werner
Semiconductor Science and Technology 12, 224 (1997)
Role of critical grain size of nuclei for homoepitaxy of polycrystalline Si
J. Kühnle, R. B. Bergmann, and J.H. Werner
J. Crystal Growth 173, 62 (1997)

Large area polycrystalline silicon thin films grown by laser-induced nucleation and solid phase crystallization
D. Toet, B. Koopmans, R.B. Bergmann, B. Richards, P.V. Santos, M. Albrecht, and J. Krinke
Thin Solid Films 296, 49 (1997)

 

1996

Growth of polycrystalline silicon on glass by selective laser-induced nucleation
D. Toet, B. Koopmans, P. V. Santos, R.B. Bergmann and B. Richards
Appl. Phys. Letters 69, 3719 (1996)

Crystalline silicon films by chemical vapor deposition on glass for thin film solar cells
R. B. Bergmann, R. Brendel, M. Wolf, P. Lölgen, J.H. Werner, J. Krinke, and H.P. Strunk
Proc. 25th IEEE PVSEC, (IEEE, Piscataway, 1996), p. 365

Comparison of vapor phase and liquid phase epitaxy for deposition of crystalline Si on glass
J. Kühnle, R.B. Bergmann, J. Krinke, and J.H. Werner
Mat. Res. Soc. Symp. Proc. 426, 111 (1996)

Growth of polycrystalline silicon using selective nucleation by laser interference crystallization
D. Toet, P.V. Santos, R. B. Bergmann, G. Aichmayr and M. Heintze
Proc. 23rd Internat. Conf. on the Physics of Semiconductors, Eds.: M. Scheffler and R. Zimmermann (World Scientifc, Singapore, 1996), p. 1123

Optical in-situ monitoring of solid phase crystallization of amorphous silicon
R. B. Bergmann
J. Crystal Growth 165, 341 (1996)

Silicon surface passivation by metal layers for low-temperature epitaxy
Jürgen Kühnle, Ralf Bergmann, Jürgen H. Werner, and Martin Albrecht
J. Crystal Growth 163, 470 (1996)

Polycrystalline silicon on glass substrates for thin film solar cells
R. Bergmann, G. Oswald, M. Albrecht, and J. H. Werner
Solid State Phenomena 51-52, 515 (1996)

The effects of solvent and dopant impurities on the performance of LPE silicon solar cells
Z. Shi, W. Zhang, G. F. Zheng, V. L. Chin, A. Stephens, M. A. Green and R. Bergmann
Solar Energy Materials and Solar Cells 41/42, 53 (1996)

 

1993-1995
The growth and properties of liquid phase epitaxial silicon in a forming gas ambient
Z. Shi, W. Zhang, G.F. Zheng, J. Kurianski, M.A. Green and R. Bergmann, J. Crystal Growth 151, 278 (1995)

Polycrystalline silicon for thin film solar cells
R. Bergmann, J. Kühnle, J.H. Werner, S. Oelting, M. Albrecht, H.P. Strunk, K. Herz and M. Powalla
in: Proc. 1st World Conf. on Photovoltaic Energy Conversion, (IEEE, Piscataway, 1994), p. 1398-1401

Thin film silicon solar cells by LPE and substrate thinning techniques
Z. Shi, G.F. Zheng, W. Zhang, S.J. Robinson, M.A. Green, and R. Bergmann
in: Proc. 12th European Photovoltaic Solar Energy Conference, Eds.: R. Hill, W. Palz, P. Helm (H.S. Stephens & Associates, Bedford, 1994), p. 1835

Opto-electronic characterisation of thin-film crystalline silicon solar cells grown from metal solutions
S.J. Robinson, G-F. Zheng, W. Zhang, Z. Shi, M.A. Green, and R. Bergmann
in: Proc. 12th European Photovoltaic Solar Energy Conference, Eds.: R. Hill, W. Palz, P. Helm (H.S. Stephens & Associates, Bedford, 1994), p. 1831

The challenge of crystalline thin film silicon solar cells
J.H. Werner, R. Bergmann, and R. Brendel
in: Festkörperprobleme / Advances in Solid State Physics Vol. 34, Ed: R. Helbig (Vieweg, Braunschweig, 1994), p. 115 – 146

Kristallzüchtung für die Photovoltaik – Forschung in Deutschland“ (Crystal Growth for Photovoltaics – Research in Germany)
R. Bergmann and J.H. Werner
Mitteilungsblatt der Deutschen Gesellschaft für Kristallwachstum und Kristallzüchtung Vol. 59 (German Society for Crystal Growth), May 1994, p.15

Solution growth of silicon on Al-Si coated quartz glass substrates
S.H. Lee, R. Bergmann, E. Bauser and H.J. Queisser

Materials Letters 19, 1 (1994)

Thin film silicon solar cells on glass by substrate thinning
G.F. Zheng, Z. Shi, R. Bergmann, X. Dai, S. Robinson, A. Wang, J. Kurianski and M.A. Green
Solar Energy Materials and Solar Cells 32, 129 (1994)

Silicon films incorporating a drift-field grown by liquid phase epitaxy for solar cell applications
R. Bergmann, S. Robinson, Z. Shi and J. Kurianski
Solar Energy Materials and Solar Cells 31, 447 (1993)

The role of hydrogen in silicon liquid phase epitaxy
R. Bergmann and J. Kurianski
Materials Letters 17, 137 (1993)

 

1988-1992

Investigation of epitaxial lateral overgrowth by x-ray topography
R. Köhler, B. Jenichen, E. Bauser and R. Bergmann
J. Appl. Phys. 72, 405 (1992)

High quality GexSi1-x by heteroepitaxial lateral overgrowth
P. O. Hansson, A. Gustafsson, M. Albrecht, R. Bergmann, H.P. Strunk, and E. Bauser
J. Crystal Growth 121, 790 (1992)

First MOS transistors on insulator by silicon saturated liquid solution epitaxy
R. P. Zingg, N. Nagel, R. Bergmann, E. Bauser, B. Höfflinger and H. .J. Queisser
IEEE Electron Device Letters 13, 294 (1992)

Selective liquid-phase epitaxy of silicon for microelectronics applications
N. Nagel, R. P. Zingg, R. Bergmann, and E. Bauser
in: Micro Systems Technologies ’92, Ed. H. Reichl (VDE-Verlag, Berlin, 1992), p. 135

MOS-transistors with epitaxial Si, laterally grown over SiO2 by liquid phase epitaxy
R. Bergmann, E. Czech, I. Silier, N. Nagel, E. Bauser, H. .J. Queisser, R. P. Zingg and B. Höfflinger
Appl. Phys. A 54, 103 (1992)

Epitaxial lateral overgrowth of silicon on SiO2 investigated by x-ray topography
B. Jenichen, R. Köhler, N. Nagel, R. Bergmann, and E. Bauser
in: Mechanisms of Heteroepitaxial Growth, Mat. Res. Soc. Symp. Vol. 263, Eds.: M.F. Chisholm, R. Hull, L.J. Schowalter, B.J. Garrison, (Mater. Res. Soc., Pittsburgh, 1992) p.215

Heteroepitaxial lateral overgrowth of GexSi1-x over SiO2/Si structures by liquid phase epitaxy
P.O. Hansson, R. Bergmann and E. Bauser
J. Crystal Growth 114, 573 (1991)

Dislocation generation in silicon grown laterally over SiO2 by liquid phase epitaxy
F. Banhart, R. Bergmann, F. Phillipp, and E. Bauser
Appl. Physics A 53, 317 (1991)

Model for defect-free epitaxial lateral overgrowth of Si over SiO2 by liquid phase epitaxy
R. Bergmann
J. Crystal Growth 110, 823 (1991)

Silicon layers grown over SiO2 by liquid phase epitaxy – an electron microscopical study
F. Banhart, F. Phillipp, R. Bergmann, E. Czech, M. Konuma, and E. Bauser
in: Proc. 12th Int. Congress for Electron Microscopy, Seattle WA, Vol.4, Eds.: L.D. Peachey, D.B. Williams, (San Francisco Press, San Francisco, 1990) p.566

Defect-free epitaxial lateral overgrowth of oxidized (111) Si by liquid phase epitaxy
R. Bergmann, E. Bauser and J. H. Werner
Appl. Phys. Lett. 57, 351 (1990)

Determination of recombination parameters in silicon solar cells using light induced transients
W. Warta, R. Bergmann, and B. Voss
in: Proc. 8th E.C. Photovoltaic Solar Energy Conference, Eds.: I. Solomon, B. Equer and P. Helm (Kluver Academic Publishers, Dordrecht, 1988) Vol.2, p.1416