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Scalable Topometry
Contact: Dr. rer. nat. Christoph von Kopylow
Publications
Kayser, D., Bothe, T., Osten, W.:" Scaled topometry in a multisensor approach", Opt. Eng. 43, (2004), p. 2469-2477
Kayser, D.; Bothe, T.; Osten, W.:
" An integrated measurement system for the inspection of extended surfaces in industrial quality control", Proc. Intern Symposium Photonics in Measurement. VDI-Berichte 1694, Düsseldorf 2002, pp. 339-344
Kayser, D.; Bothe, T.; Osten, W.; Windecker, R.; Tiziani, H.:
"Integrated surface measurement using the concept of scaled metrology", Proc. Fringe 2001, Elsevier Sc. 2001, pp. 427-434
Osten, W., Kayser, D., Jüptner, W.:
" An active approach for high resolution measurement on technical surfaces", Proc. Intern Symposium Photonics in Measurement. VDI-Berichte???, 2000, p.???
Osten, W.; Kayser, D.; Bothe, T.; Jüptner, W.:
"High resolution measurement of extended technical surfaces with scalable topometry", Proc. SPIE Vol. 4101A, 2000, pp. 166-172
Kayser, D.; Osten, W.; Bothe, T.:
" Fault detection in gray-value images of surfaces on different scales", Proc. SPIE 3744, 1999, pp. 110-117