Measuring Principle

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- Generation of straight fringes in the coordinate plane.
- Recording of deformed fringes on the object (reflection).
- Analysing surface angles as well as other analysing of curvature
and 3D form.
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Obtained Data
| Angle of the normal surfaces |
=> locale curvature |
=> 3D Form (height) |
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Area of Application
In general measurement of all reflective surfaces.
Examples
| Liquids |
(plastic) Lenses |
Lacquer (orang peel paint effect) |
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Technical Data
| Pixel resolution |
|
| Depth |
1 nm |
| Lateral |
measuring field width / 1000 |
| Gradient |
1,8" bzw. 10-5 |
| Curvature |
0,05 D |
| Measuring time |
1s ... 600s (variable after wanted resolution) |
Measuring Examples
Software
Publications
Bothe, T., Li, W., v. Kopylow, C. & Bergmann, R.:
"
The Fringe Reflection Technique for Lens Inspection and Specular
Freeform Measurement"
In: MAFO Ophthalmic Labs & Industry 5 (2009), Nr. 1, S. 38-42
Klattenhoff, R., Bothe, T., Gesierich, A. , Li, W., Kopylow, C.,
Jüptner, W.:
"
Flexibles Streifenreflexionssystem zur topologischen Prüfung der
Flugzeugaußenhaut und anderer glänzender Oberflächen" (
Vortragsfolien),
Tagungsband der Oldenburger 3D-Tage, in "Photogrammetrie,
Laserscanning, Optische 3D-Messtechnik", Hrsg. T. Luhmann, Wichmann
Verlag, Augsburg, (Februar 2006)
Bothe, T., Schulte, H., Li, W., Riemer, O., Jüptner, W.:
"
Fast sub-µm Optical Removal Rate Evaluation for Polishing",
Proc. 6th Euspen, eds.: (2006); Vol. 1
(Talk & Short Abstract:) Bothe, T.; Li, W.; Gesierich, A.; Kopylow,
C.; Jüptner, W.:
"High-resolution 3D shape measurement on surfaces of optical quality by
fringe reflection", CIRP Annual Meeting, STC S, Paris. (January, 27th
2006)
Bothe, T., Li, W.; Gesierich, A.; Kopylow, C.; Jüptner, W.:
"Streifenreflexion: 3D-Oberflächentopometrie an optischen Oberflächen",
Proc. of SFB-TR4 3. Industriekolloquium, Bremen, (25. November
2005)
Bothe, T., Li, W., Kopylow, C., Jüptner, W.:
"
Fringe Reflection for high resolution topometry and surface description
on variable lateral scales",
Proc. FRINGE '05, Springer (2005), 362-371
Bothe, T.:
"
Es ist nicht alles glatt, was glänzt.: Neues Verfahren ermöglicht die
3D-Messung von spiegelnden Oberflächen bis in den Nanobereich";
Idee-Express; Carl Ed. Schünemann KG, Bremen, Herbst 2005
(Talk & Sheets on CD:) Bothe, T.:
"High-resolution 3D shape measurement on specular surfaces by fringe
reflection" ; Proc. of CC UPOB Workshop "Advances in Optical Mold
Fabrication", Bremen, (May, 24th 2005)
Bothe, T.; Li, W.; Jüptner, W.; Brinksmeier, E.:
High-resolution 3D shape measurement on specular surfaces by fringe
reflection", Proc. of euspen seminar" Ultra Precision Optics - Meeting
the Manufacturing Challenge & The Metrology of Advanced Optics",
Montpellier, (2005), 20 - 23
Gläbe, R.; Flucke, C.; Bothe, T.; Brinksmeier, E.:
"
High Speed Fringe Reflection Technique for nm Resolution Topometry of
Diamond Turned Free Form Mirrors", Proc. 5th Euspen, eds.: F.
Chevrier, T. Taliercio, P. Falgayrettes, P. Gall-Borrut, Professionnel
Action Photo - PAP, Montpellier (2005); Vol. 1, 25-28
Bothe, T., Li, W., Gesierich, A., Kopylow, C., Jüptner, W.:
"
Streifenreflexion - 3D-Oberflächentopometrie an glänzenden
Objekten" (
Vortragsfolien), Tagungsband der Oldenburger 3D-Tage, in
"Photogrammetrie, Laserscanning, Optische 3D-Messtechnik", Hrsg. T.
Luhmann, Wichmann Verlag, Augsburg, (Februar 2005), 38-53
Bothe, T., Li, W., Kopylow, C., Jüptner, W.:
"
High-resolution 3D shape measurement on specular surfaces by fringe
reflection",
Proc. SPIE Int. Soc. Opt. Eng. 5457, (2004), 411 422
Bothe, T., Li, W., Riemer2, O. , Jüptner, W.:
"
Evaluation Methods for Gradient Measurement Techniques",
Proc. SPIE Int. Soc. Opt. Eng. 5457, (2004), 300-311