Wagner, C.; Osten, W.; Seebacher, S.
Direct Shape Measurement by Digital Wavefront Reconstruction and Wavelength Scanning, Optical Engineering (to be published)

Osten, W.
The Application of Optical Shape Measurement for the Nondestructive Evaluation of Complex Objects, Optical Engineering (to be published)

Osten, W.
Digital processing and Evaluation of Fringe Patterns in Optical Metrology and Non-Destructive Testing
In: K.-H. Laermann (Ed.): Modern Optical Methods in Experimental Solid Mechanics, Springer Verlag Wien 1999 (to be published)

Wagner, C.; Seebacher, S.; Osten, W.; Jüptner, W.
Digital Recording and Numerical Reconstruction of Lensless Fourier Holograms in Optical Metrology, Appl. Opt. (accepted for publication)

Bothe, T., Li, W., Gesierich, A., Kopylow, C., Jüptner, W.:
" Streifenreflexion - 3D-Oberflächentopometrie an glänzenden Objekten" ( Vortragsfolien), Tagungsband der Oldenburger 3D-Tage, in "Photogrammetrie, Laserscanning, Optische 3D-Messtechnik", Wichmann Verlag, Augsburg, 2005, temporärer Entwurf

Li, W., Bothe, T., Kopylow, C., Jüptner, W.:
"Evaluation Methods for Gradient Measurement Techniques", Proc. SPIE Int. Soc. Opt. Eng. 5457, (2004), p. 300-311

Bothe, T., Li, W., Kopylow, C., Jüptner, W.:
"High Resolution 3D Shape Measurement on Specular Surfaces by Fringe Reflection", Proc. SPIE Int. Soc. Opt. Eng. 5457, (2004), p. 411 422

Bothe, T., Gesierich, A., Kopylow, C., Jüptner, W., Osten, W.:
"3D-Kamera - ein miniaturisiertes Streifenprojektionssystem", Infobörse Mikrosystemtechnik, 50-2004

Bothe, T., Gesierich, A., Kopylow, C., Jüptner, W.:
"3D-Kamera - ein miniaturisiertes Streifenprojektionssystem zur Formerfassung", Tagungsband der Oldenburger 3D-Tage, in "Photogrammetrie, Laserscanning, Optische 3D-Messtechnik", Wichmann Verlag, Augsburg, Februar 2004, P. 38-47

Legarda-Saenz, R., Bothe, T., Jüptner, W.:
"Accurate Procedure for the Calibration of a Structured Light System", Opt. Eng. 43 (2), 2004, p.464-471

Kayser, D., Bothe, T., Osten, W.:
" Scaled topometry in a multisensor approach", Opt. Eng. 43, (2004), p. 2469-2477

Li, W.; Bothe, T.; Osten, W.:
"Object Adapted Pattern Projection - part I: Generation of Inverse Patterns", OLE 41 (2004) 31-50

Li, W., Bothe, T., Kalms, M., von Kopylow, C., Jüptner, W.:
"Applications for Inverse Pattern Projection"; Proc. SPIE; Volume 5144 (2003); p. 493-503

Bothe, T., Li, W., von Kopylow, C., Jüptner, W.:
"Object Adapted Inverse Pattern Projection: Generation, Evaluation and Applications "; Proc. SPIE; Volume 4933 (2003); p. 291-296

Bothe, T.; Li, W.; v. Kopylow, C.; Jüptner, W.:
"Erzeugung und Auswertung von objektangepassten inversen Projektionsmustern", tm - Technisches Messen, 70 (2003) 2, 99-103

Bothe, T., Gesierich, A., Legarda-Sàenz, R., Jüptner, W.:
"3D-Camera", Proc. SPIE; Vol-ume 5144 (2003); p. 295-306

Bothe, T.; Li, W., Osten, W.; Jüptner, W.:
"Generation and Evaluation of Object Adapted Inverse Patterns", International Symposium on Photonics in Measurement, VDI_Berichte 1694, 2002, 299-304

Burke, J.; Bothe, T.; Osten, W.; Hess, C.:
"Reverse Engineering by Fringe Projection", Proc. SPIE Vol.4778, 2002, pp. 312-324

Bothe, T.; Osten, W.; Gesierich, A.; Jüptner, W.:
"Compact 3D-Camera", Proc. SPIE Vol.4778, 2002, pp. 48-59

Kayser, D.; Bothe, T.; Osten, W.:
" An integrated measurement system for the inspection of extended surfaces in industrial quality control", Proc. Intern Symposium Photonics in Measurement. VDI-Berichte 1694, Düsseldorf 2002, pp. 339-344

Kayser, D.; Bothe, T.; Osten, W.; Windecker, R.; Tiziani, H.:
"Integrated surface measurement using the concept of scaled metrology", Proc. Fringe 2001, Elsevier Sc. 2001, pp. 427-434

Körner, K.; Droste, U.; Windecker, R.; Fleischer, M.; Tiziani, H.; Bothe, T.; Osten, W.:
" Projection of Structured Light in Object Planes of Varying Depths for Absolute 3D Profiling in a Triangulation Setup", Proc. SPIE Vol 4398, 2001, pp. 23-34

Körner, K.; U. Droste, R. Windecker, M. Fleischer, H. Tiziani, T. Bothe, W. Osten:
" Depth-Scanning Fringe Projection for Absolute 3-D Profiling", Proc. Fringe 2001, Elsevier Sc. 2001, pp. 394-401

Osten, W., Kayser, D., Jüptner, W.:
" An active approach for high resolution measurement on technical surfaces", Proc. Intern Symposium Photonics in Measurement. VDI-Berichte???, 2000, p.???

Osten, W.; Kayser, D.; Bothe, T.; Jüptner, W.:
"High resolution measurement of extended technical surfaces with scalable topometry", Proc. SPIE Vol. 4101A, 2000, pp. 166-172

Kayser, D.; Osten, W.; Bothe, T.:
" Fault detection in gray-value images of surfaces on different scales", Proc. SPIE 3744, 1999, pp. 110-117

Meinlschmidt, P., Bothe, T., Hinsch, K., Mehlhorn, L.:
" Nondestructive testing and evaluation of historical monuments using thermography and electronic speckle pattern interferometry (ESPI)", Proc. SPIE Int. Soc. Opt. Eng. 3396, (1998), p. 28-36

Seebacher, S.; Osten, W.; Jüptner, W.
Measuring shape and deformation of small objects using digital holography, Proc. SPIE Vol. 3479(1998), pp. 104-115

Elandaloussi, F.; Osten, W.; Jüptner; W.
Automatic flaw detection using recognition by synthesis: Practical results, Proc. SPIE Vol. 3479(1998), pp. 228-234

Osten, W.; Jüptner, W.; Seebacher, S.
The qualification of large scale approved measurement techniques for the testing of microcomponents, Proc. 18th Symposium on Experimental Mechanics of Solids, Jachranka 1998, pp. 43-55

Jüptner, W.; Kujawinska, M.; Osten, W.; Salbut, S.; Seebacher, S.
Combined Measurement of Silicon Microbeams by Grating Interferometry and Digital Holography, Proc. SPIE Vol. 3407(1998), pp. 348-357

Kujawinska, M.; Osten, W.
Fringe pattern analysis methods: Up-to-date review, Proc. SPIE Vol. 3407(1998), pp. 56-66

Osten, W.
Active optical metrology - a definition by examples, Proc. SPIE Vol. 3478(1998), pp. 11-25

Sirohi, R. S.; Burke, J.; Bothe, T.; Helmers, H.; Hinsch, K. D.:
"New Applications of Michelson Stellar Interferometer in Speckle Metrology using Spatial Phase-Shifting", Proc. FRINGE '97 (1997) 489-496, Akademie-Verlag, Berlin

Burke, J.; Bothe, T.; Helmers, H.; Kunze, C.; Sirohi, R. S.; Wilkens, V.:
" Spatial Phase Shifting in ESPI: Influence of second-Order Speckle Statistics on Fringe Quality" ( ApplOpt36-22), Proc. FRINGE '97 (1997) 111-116, Akademie-Verlag, Berlin

Bothe, T.; Burke, J.; Helmers, H.:
"Spatial phase shifting in ESPI: minimization of phase reconstruction errors", Appl. Opt. 36.22 (1997) 5310-5316

Osten, W.; Jüptner, W.
Digital Processing of Fringe Patterns, In: Rastogi, P.K. (Ed.): Optical Measurement Techniques and Applications, Artech House Inc., Boston & London 1997, pp. 51- 85

Osten, W.; Elandaloussi, F., Jüptner, W.
Recognition by synthesis - a new approach for the recognition of material faults in HNDE, Proc. SPIE Vol. 2861(1996), 220-224

Mieth, U.; Osten, W.; Jüptner, W.
Numerical investigations on the appearance of material flaws in holographic interference patterns, Proc. International Symposium on Laser Application in Precision Measurement, Balatonfüred 1996, Akademie Verlag Berlin 1996, 218-225

Osten, W.; Jüptner, W.
Measurement of displacement vector fields of extended objects, Opt. & Lasers in Eng. 24(1996), 261-285

Nadeborn, W.; Osten, W.; Andrä, P.
A robust procedure for absolute phase measurement, Opt. & Lasers in Eng. 24(1996), 245-260

Burke, J., Bothe, T., Kunze, C., Wilkens, V., Helmers, H.:
"Fehlerminimierte Phasenrekonstruktion beim Einsatz des räumlichen Phasenschiebens in der elektronischen Specklemuster-Interferometrie", DGaO1996

Bothe, T., Burke, J., Helmers, H.:
"Praktische Aspekte zum Einsatz des räumlichen Phasenschiebens in der Interferometrie und der Elektronischen Specklemuster-Interferometrie (ESPI)", DGaO1995

Colin, A.; Osten, W.
Automatic Support for Consistent Labeling of Skeletonized Fringe Patterns, J. Mod. Opt. 42(1995)5, 945-954

Yu, Q.; Andresen, K.; Osten, W.; Jüptner, W.
Analysis and removing of the systematic phase error in interferograms, Opt. Eng. 33(1994)5, 1630-1637

Osten, W.; Jüptner, W.; Mieth, U.
Knowledge assisted evaluation of fringe patterns for automatic fault detection, Proc. SPIE Vol. 2004(1993), 256-268

Jüptner, W.; Osten, W.
Digital image processing in holographic nondestructive testing, In: X:P:V: Maldague (Ed.): Advances in signal processing for nondestructive evaluation of materials. NATO ASI Series, Series E: Applied Sciences - Vol. 262, Kluwer Academic Publishers, Dordrecht, Boston, London 1994, pp. 85-101

Osten, W.
Digital Processing and Evaluation of Interference Images (in German), Berlin, Akademie Verlag, 1991

Osten, W., and Höfling, R.
Digital Holographic and Speckle Interferometry, In: Frankowski, G., Abramson, N., and Füzessy, Z., (Eds.), Application of Metrological Laser Methods in Machines and Systems, Berlin, Akademie Verlag, 1991, pp. 265-298

Eichhorn, N.; Osten, W.
An algorithm for the fast derivation of line structures from interferograms, Journal of Modern Optics 35(1988)10, 1717-1725

Höfling, R.; Osten, W.
Displacement measurement by image-processed speckle patterns, J. Mod. Opt. 34(1987)5, 607-617